| Reference | Test Condition | Duratio | Lots | S. S (pcs | Accept Criteria |
JESD22-A113 J-STD-02 | Preconditioning (MSL 3): Moisture Preconditioning + 3 x reflow: UHAST/TC/PC/HAS | N/A | 1 | 308 | 0 Fail |
| JESD22-A104 | Temperature Cycle: -55℃/150℃ | 1000cy | 1 | 77 | 0 Fail |
JESD22-A103 | High Temperature Storage: 150 | 1000hrs | 1 | 77 | 0 Fail |
JESD22-A118 | Ubias Highly Accelerated Stress Test: 130℃/85%RH/33.3psia | 96hrs | 1 | 77 | 0 Fail |
| JESD22-A110 | Highly Accelerated Stress Test: 130℃/85%RH/Bias=100V | 96hrs | 1 | 77 | 0 Fail |
| JESD22-A122 | Power Cycle: -25℃/150℃/ΔTvj=100℃ | 10000cy | 1 | 77 | 0 Fail |
| JESD22-A108 | High Temp Gate Bias: 150℃/6V VGS | 1000hrs | 1 | 77 | 0 Fail |
JESD22-A10 | High Temp Reverse Bias 150℃/520V VD | 1000hrs | 1 | 77 | 0 Fail |
JS-001-2014 | Human Body Model ESD | N/A | 1 | 3 | 0 Fail |
JS-001-2014 | Charged Device Model ESD | N/A | 1 | 3 | 0 Fail |